Semiconductor Engineering

Wafer Bin Map Defect Classification Using Semi-Supervised Learning

A new technical paper titled “Semi-Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea University. “Semi-supervised learning ...
Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
pv magazine International

Ensemble deep learning for PV cell defect detection

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...
Edex Live on MSN

Greenwood High alumni win top prize at Purdue AI showcase

Two alumni of Greenwood High International School have secured first place in the poster competition at Purdue University's ...